Ion trap mass spectrometry using high-pressure ionization

Analytical Chemistry 1994 / 07 Vol. 66; Iss. 14

Ion trap mass spectrometry using high-pressure ionization

McLuckey, Scott A., Van Berkel, Gary J., Goeringer, Douglas E., Glish, Gary L.
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Volume:
66
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac00086a001
Date:
July, 1994
File:
PDF, 5.52 MB
english, 1994
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