[IEEE 2010 IEEE International Symposium on Circuits and Systems - ISCAS 2010 - Paris, France (2010.05.30-2010.06.2)] Proceedings of 2010 IEEE International Symposium on Circuits and Systems - Analysis of NBTI-induced SNM degradation in power-gated SRAM cells
Calimera, Andrea, Macii, Enrico, Poncino, MassimoYear:
2010
Language:
english
DOI:
10.1109/iscas.2010.5537452
File:
PDF, 185 KB
english, 2010