![](/img/cover-not-exists.png)
The Jump-to-Contact Distance in Atomic Force Microscopy Measurement
Wu, Jiunn-JongVolume:
86
Language:
english
Journal:
The Journal of Adhesion
DOI:
10.1080/00218464.2010.519256
Date:
November, 2010
File:
PDF, 488 KB
english, 2010