The Jump-to-Contact Distance in Atomic Force Microscopy...

The Jump-to-Contact Distance in Atomic Force Microscopy Measurement

Wu, Jiunn-Jong
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Volume:
86
Language:
english
Journal:
The Journal of Adhesion
DOI:
10.1080/00218464.2010.519256
Date:
November, 2010
File:
PDF, 488 KB
english, 2010
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