Investigations on KTN thin films by XRD, XPS and micro...

Integrated Ferroelectrics 2000 / 03 Vol. 29; Iss. 1-2

Investigations on KTN thin films by XRD, XPS and micro raman spectroscopy

Savvinov, A. A., Siny, I. G., Katiyar, R. S., Pumarol, M., Mourad, H. A., Fernandez, F. E.
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Volume:
29
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580008216670
Date:
March, 2000
File:
PDF, 524 KB
english, 2000
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