Interferometry for Ellipso-Height-Topometry part 3:...

Interferometry for Ellipso-Height-Topometry part 3: Correction of the aspect errors and reduction of the dispersion of the ellipsometric parameters

Leonhardt, K.
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Volume:
125
Language:
english
Journal:
Optik - International Journal for Light and Electron Optics
DOI:
10.1016/j.ijleo.2014.06.040
Date:
September, 2014
File:
PDF, 3.26 MB
english, 2014
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