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[IEEE 2012 80th ARFTG Microwave Measurement Conference - San Diego, CA, USA (2012.11.29-2012.11.30)] 80th ARFTG Microwave Measurement Conference - Pulsed RF calibration for NVNA measurements
Roblin, Patrick, Ko, Youngseo, Jang, Haedong, Teyssier, Jean PierreYear:
2012
Language:
english
DOI:
10.1109/arftg.2012.6422437
File:
PDF, 1.85 MB
english, 2012