Measurement of vanadium impurity in oxygen-implanted...

Measurement of vanadium impurity in oxygen-implanted silicon by isotope dilution and resonance ionization mass spectrometry

Mayo, Santos., Fassett, John D., Kingston, Howard M., Walker, Richard J.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
62
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac00202a003
Date:
February, 1990
File:
PDF, 751 KB
english, 1990
Conversion to is in progress
Conversion to is failed