X-ray photoelectron spectroscopic study of rare-earth-doped...

X-ray photoelectron spectroscopic study of rare-earth-doped amorphous silicon–nitrogen films

Zanatta, A. R., Ribeiro, C. T. M., Alvarez, F.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
93
Year:
2003
Language:
english
DOI:
10.1063/1.1536015
File:
PDF, 842 KB
english, 2003
Conversion to is in progress
Conversion to is failed