Quantitative measurement of residual biaxial stress by...

Quantitative measurement of residual biaxial stress by Raman spectroscopy in diamond grown on a Ti alloy by chemical vapor deposition

Ager, Joel W., Drory, Michael D.
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Volume:
48
Language:
english
Journal:
Physical Review B
DOI:
10.1103/physrevb.48.2601
Date:
July, 1993
File:
PDF, 450 KB
english, 1993
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