Optical and Structural Characterization of Erbium-Doped...

Journal of The Electrochemical Society 2001 Vol. 148; Iss. 2

Optical and Structural Characterization of Erbium-Doped TiO[sub 2] Xerogel Films Processed on Porous Anodic Alumina

Gaponenko, N. V., Sergeev, O. V., Stepanova, E. A., Parkun, V. M., Mudryi, A. V., Gnaser, H., Misiewicz, J., Heiderhoff, R., Balk, L. J., Thompson, G. E.
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Volume:
148
Year:
2001
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.1339864
File:
PDF, 201 KB
english, 2001
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