Stress distribution in thin heteroepitaxial diamond films on Ir/SrTiO[sub 3] studied by x-ray diffraction, Raman spectroscopy, and finite element simulations
Schreck, M., Roll, H., Michler, J., Blank, E., Stritzker, B.Volume:
88
Year:
2000
Language:
english
DOI:
10.1063/1.1287521
File:
PDF, 699 KB
english, 2000