Voltammetric Characterization of Oxide Films Formed on...

Journal of The Electrochemical Society 2001 Vol. 148; Iss. 11

Voltammetric Characterization of Oxide Films Formed on Copper in Air

Nakayama, Shigeyoshi, Kimura, Atsushi, Shibata, Masahiro, Kuwabata, Susumu, Osakai, Toshiyuki
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Volume:
148
Year:
2001
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.1409545
File:
PDF, 140 KB
english, 2001
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