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[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting - 25nm 64Gb MLC NAND technology and scaling challenges invited paper
Prall, Kirk, Parat, KrishnaYear:
2010
Language:
english
DOI:
10.1109/iedm.2010.5703300
File:
PDF, 687 KB
english, 2010