Direct analysis of thin-layer chromatography spots by...

Analytical Chemistry 1984 / 12 Vol. 56; Iss. 14

Direct analysis of thin-layer chromatography spots by diffuse reflectance Fourier transform infrared spectrometry

Zuber, Gary E., Warren, Richard J., Begosh, Peter P., O'Donnell, Ellen L.
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Volume:
56
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac00278a071
Date:
December, 1984
File:
PDF, 588 KB
english, 1984
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