X-ray Photoelectron Spectroscopic Analysis of Si...

Journal of Physical Chemistry B 2006 / 01 Vol. 110; Iss. 3

X-ray Photoelectron Spectroscopic Analysis of Si Nanoclusters in SiO 2 Matrix

Dane, Aykutlu, Demirok, U. Korcan, Aydinli, Atilla, Suzer, Sefik
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Volume:
110
Language:
english
Journal:
The Journal of Physical Chemistry B
DOI:
10.1021/jp0545748
Date:
January, 2006
File:
PDF, 207 KB
english, 2006
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