A Bayesian Scheme to Detect Changes in the Mean of a Short-Run Process
Tsiamyrtzis, Panagiotis, Hawkins, Douglas MVolume:
47
Language:
english
Journal:
Technometrics
DOI:
10.1198/004017005000000346
Date:
November, 2005
File:
PDF, 516 KB
english, 2005