[IEEE 31st European Solid-State Device Research Conference...

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[IEEE 31st European Solid-State Device Research Conference - Nuremberg, Germany (2001.9.11-2001.9.13)] 31st European Solid-State Device Research Conference - Impact of Channel Engineering Technology on HC Performance of 100 nm MOSFETs

Okhonin, S., Fazan, P., Kubicek, S., Henson, K., De Meyer, K., Ponomarev, Y.V.
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Year:
2001
DOI:
10.1109/essderc.2001.195256
File:
PDF, 184 KB
2001
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