[IEEE 31st European Solid-State Device Research Conference - Nuremberg, Germany (2001.9.11-2001.9.13)] 31st European Solid-State Device Research Conference - Impact of Channel Engineering Technology on HC Performance of 100 nm MOSFETs
Okhonin, S., Fazan, P., Kubicek, S., Henson, K., De Meyer, K., Ponomarev, Y.V.Year:
2001
DOI:
10.1109/essderc.2001.195256
File:
PDF, 184 KB
2001