Development of a “best representativity” method for experimental data analysis and an application to the critical experiments at the Toshiba NCA facility
Umano, Takuya, Yoshioka, Kenichi, Obara, ToruVolume:
51
Language:
english
Journal:
Journal of Nuclear Science and Technology
DOI:
10.1080/00223131.2014.884953
Date:
May, 2014
File:
PDF, 1.11 MB
english, 2014