Dielectric breakdown in high-ε films for ULSI DRAMs: II....

Dielectric breakdown in high-ε films for ULSI DRAMs: II. barium-strontium titanate ceramics

Scott, J. F., Azuma, M., Paz de Araujo, C. A., McMillan, L. D., Scott, M. C., Roberts, T.
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Volume:
4
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589408018661
Date:
February, 1994
File:
PDF, 1.33 MB
english, 1994
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