Extraction of Channel Electron Effective Mobility in...

Extraction of Channel Electron Effective Mobility in InGaAs/Al $_{\bf 2}$O$_{\bf 3}$ n-FinFETs

Hu, Yaodong, Li, Shengwei, Jiao, Guangfan, Wu, Y. Q., Huang, Daming, Ye, Peide D., Li, Ming-Fu
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
12
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/tnano.2013.2274282
Date:
September, 2013
File:
PDF, 397 KB
english, 2013
Conversion to is in progress
Conversion to is failed