![](/img/cover-not-exists.png)
Extraction of Channel Electron Effective Mobility in InGaAs/Al $_{\bf 2}$O$_{\bf 3}$ n-FinFETs
Hu, Yaodong, Li, Shengwei, Jiao, Guangfan, Wu, Y. Q., Huang, Daming, Ye, Peide D., Li, Ming-FuVolume:
12
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/tnano.2013.2274282
Date:
September, 2013
File:
PDF, 397 KB
english, 2013