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Full-wave modelling and broadband characterization of coupled interconnects in high-speed VLSI
Yuan, Zheng-Yu, Li, Zheng-Fan, Zou, Min-LiuVolume:
87
Language:
english
Journal:
International Journal of Electronics
DOI:
10.1080/00207210050028779
Date:
July, 2000
File:
PDF, 283 KB
english, 2000