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First application of Cc-corrected imaging for high-resolution and energy-filtered TEM
Kabius, B., Hartel, P., Haider, M., Muller, H., Uhlemann, S., Loebau, U., Zach, J., Rose, H.Volume:
58
Language:
english
Journal:
Journal of Electron Microscopy
DOI:
10.1093/jmicro/dfp021
Date:
June, 2009
File:
PDF, 1.60 MB
english, 2009