[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - IEEE P1687: Toward Standardized Access of Embedded Instrumentation
Posse, Ken, Crouch, Al, Rearick, Jeff, Eklow, Bill, Laisne, Mike, Bennetts, Ben, Doege, Jason, Ricchetti, Mike, Cote, J-fYear:
2006
Language:
english
DOI:
10.1109/test.2006.297744
File:
PDF, 9.88 MB
english, 2006