![](/img/cover-not-exists.png)
Statistical approach for contact angle determination on inclining surfaces: “slow-moving” analyses of non-axisymmetric drops on a flat silanized silicon wafer
Schmitt, Michael, Hempelmann, Rolf, Ingebrandt, Sven, Munief, Walid, Durneata, Dan, Groβ, Katja, Heib, FlorianVolume:
55
Language:
english
Journal:
International Journal of Adhesion and Adhesives
DOI:
10.1016/j.ijadhadh.2014.08.007
Date:
December, 2014
File:
PDF, 1.41 MB
english, 2014