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[IEEE 2014 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Columbus, OH, USA (2014.6.23-2014.6.28)] 2014 IEEE Conference on Computer Vision and Pattern Recognition Workshops - Effect of Pupil Dilation and Constriction on the Distribution of Bit Errors within the Iris
Tomeo-Reyes, Inmaculada, Chandran, VinodYear:
2014
Language:
english
DOI:
10.1109/cvprw.2014.12
File:
PDF, 462 KB
english, 2014