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[IEEE 2013 13th International Workshop on Junction Technology (IWJT) - Kyoto, Japan (2013.06.6-2013.06.7)] 2013 13th International Workshop on Junction Technology (IWJT) - A study of new type CMOS inverter with Gated-IIP load and TFET driver for 22nm technology node
Huang, Hsueh-Liang, Lin, Jyi-Tsong, Tsai, Chen-Chi, Chen, Kuan-Yu, Lu, You-Ren, Hsu, Shih-Wen, Lin, Po-HsiehYear:
2013
Language:
english
DOI:
10.1109/iwjt.2013.6644518
File:
PDF, 1.17 MB
english, 2013