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[IEEE 2006 International Conference on MEMS, NANO, and Smart Systems - Cairo, Egypt (2006.12.27-2006.12.29)] 2006 International Conference on MEMS, NANO, and Smart Systems - System on Chip (SOC) design pressures reach critical point
ElTahawy, HazemYear:
2006
DOI:
10.1109/icmens.2006.348200
File:
PDF, 21 KB
2006