Maximum probing depth of low-energy photoelectrons in an...

Journal of Electron Spectroscopy and Related Phenomena 2014 / 12 Vol. 197

Maximum probing depth of low-energy photoelectrons in an amorphous organic semiconductor film

Ozawa, Yusuke, Nakayama, Yasuo, Machida, Shin’ichi, Kinjo, Hiroumi, Ishii, Hisao
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Volume:
197
Language:
english
Journal:
Journal of Electron Spectroscopy and Related Phenomena
DOI:
10.1016/j.elspec.2014.08.001
Date:
December, 2014
File:
PDF, 1.30 MB
english, 2014
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