[IEEE 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) - Seoul, Korea (South) (2011.08.7-2011.08.10)] 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) - Increasing static noise margin of single-bit-line SRAM by lowering bit-line voltage during reading
Nakata, Shunji, Suzuki, Hirotsugu, Makino, Hiroshi, Mutoh, Shin'ichiro, Miyama, Masayuki, Matsuda, YoshioYear:
2011
Language:
english
DOI:
10.1109/mwscas.2011.6026600
File:
PDF, 2.18 MB
english, 2011