Study on the Effects of Zr-Incorporated InZnO Thin-Film...

Japanese Journal of Applied Physics 2011 / 7 Vol. 50; Iss. 7

Study on the Effects of Zr-Incorporated InZnO Thin-Film Transistors Using a Solution Process

Jeong, Tae Hoon, Kim, Si Joon, Yoon, Doo Hyun, Jeong, Woong Hee, Kim, Dong Lim, Lim, Hyun Soo, Kim, Hyun Jae
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Volume:
50
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.50.070202
Date:
July, 2011
File:
PDF, 440 KB
english, 2011
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