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NON DESTRUCTIVE DIELECTRIC CHARACTERIZATION OF THIN FERROELECTRIC FILMS MATERIALS USING COPLANAR LINE STRUCTURE
KASSEM, HUSSEIN, VIGNÉRAS, VALÉRIE, LUNET, GUILLAUMEVolume:
94
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580701756268
Date:
December, 2007
File:
PDF, 460 KB
english, 2007