X-ray diffraction and reflectivity characterization of SiGe...

Semiconductor Science and Technology 1992 / 05 Vol. 7; Iss. 5

X-ray diffraction and reflectivity characterization of SiGe superlattice structures

Powell, A R, Bowen, D K, Wormington, M, Kubiak, R A, Parker, E H C, Hudson, J, Augustus, P D
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
7
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/7/5/001
Date:
May, 1992
File:
PDF, 290 KB
english, 1992
Conversion to is in progress
Conversion to is failed