[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - New method for monitoring of analogue processes-evaluation of the impact of metalisation on the performance of precise analogue resistors
Pergoot, A., Cox, P., Vercruysse, P., Wuyts, I., Raes, P.Year:
1998
Language:
english
DOI:
10.1109/icmts.1998.688026
File:
PDF, 310 KB
english, 1998