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[IEEE First International Conference on Industrial and Information Systems - Sri Lanka (2006.08.8-2006.08.11)] First International Conference on Industrial and Information Systems - A Novel BIST TPG for Testing of VLSI Circuits
Gunavathi, K., Paramasivam, K., Lavanya, P. Subashini, Umamageswaran, M.Year:
2006
Language:
english
DOI:
10.1109/iciis.2006.365646
File:
PDF, 6.00 MB
english, 2006