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[IEEE 6th International Conference on Properties and Applications of Dielectric Materials - Xi'an, China (21-26 June 2000)] Proceedings of the 6th International Conference on Properties and Applications of Dielectric Materials (Cat. No.00CH36347) - Classification of PD patterns from multiple defects
June-Ho Lee,, Okamoto, T., Chin Woo Yi,Volume:
1
Year:
2000
Language:
english
DOI:
10.1109/icpadm.2000.875730
File:
PDF, 189 KB
english, 2000