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Quantitative trace element analysis of microdroplet residues by secondary-ion mass spectrometry
Odom, Robert W., Lux, Gayle., Fleming, Ronald H., Chu, Paul K., Niemeyer, Ilsabe C., Blattner, Richard J.Volume:
60
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac00170a018
Date:
October, 1988
File:
PDF, 1.66 MB
english, 1988