[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Reliability evaluation and comparison of Class-E and Class-A power amplifiers with 0.18 μm CMOS technology
Wei-Cheng Lin,, Long-Jei Du,, Ya-Chin King,Year:
2004
Language:
english
DOI:
10.1109/relphy.2004.1315362
File:
PDF, 143 KB
english, 2004