Direct Measurements of Lateral Variations of Schottky...

Nano Letters 2012 / 02 Vol. 12; Iss. 2

Direct Measurements of Lateral Variations of Schottky Barrier Height Across “End-On” Metal Contacts to Vertical Si Nanowires by Ballistic Electron Emission Microscopy

Cai, Wei, Che, Yulu, Pelz, Jonathan P., Hemesath, Eric R., Lauhon, Lincoln J.
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Volume:
12
Language:
english
Journal:
Nano Letters
DOI:
10.1021/nl203568c
Date:
February, 2012
File:
PDF, 3.25 MB
english, 2012
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