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[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - Generation of low power dissipation and high fault coverage patterns for scan-based BIST
Seongmoon Wang,Year:
2002
Language:
english
DOI:
10.1109/test.2002.1041837
File:
PDF, 741 KB
english, 2002