![](/img/cover-not-exists.png)
Effect of the Electrode Materials on the Drain-Bias Stress Instabilities of In–Ga–Zn–O Thin-Film Transistors
Bak, Jun Yong, Yang, Sinhyuk, Ryu, Min Ki, Ko Park, Sang Hee, Hwang, Chi Sun, Yoon, Sung MinVolume:
4
Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/am301253x
Date:
October, 2012
File:
PDF, 2.47 MB
english, 2012