The electrical properties and retention characteristics of...

Integrated Ferroelectrics 2001 / 01 Vol. 37; Iss. 1-4

The electrical properties and retention characteristics of strained PZT thin film capacitors

Kim, Youngsung, Lim, Wangkyu, Lee, Jaichan
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Volume:
37
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580108015687
Date:
January, 2001
File:
PDF, 420 KB
english, 2001
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