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Thickness dependent exchange bias in co-sputter deposited Ni–Mn–Al Heusler alloy hard nanostructured thin films
Mishra, Archana, Srivastava, S.K., Kumar, Arvind, Dubey, Paritosh, Chauhan, Samta, Kumar Singh, Amit, Kaur, D., Chandra, R.Volume:
572
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2014.08.014
Date:
December, 2014
File:
PDF, 1.10 MB
english, 2014