Study of topological morphology and optical properties of...

Journal of Luminescence 2015 / 02 Vol. 158

Study of topological morphology and optical properties of SnO2 thin films deposited by RF sputtering technique

Alhuthali, A., El-Nahass, M.M., Atta, A.A., Abd El-Raheem, M.M., Elsabawy, Khaled M., Hassanien, A.M.
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Volume:
158
Language:
english
Journal:
Journal of Luminescence
DOI:
10.1016/j.jlumin.2014.09.044
Date:
February, 2015
File:
PDF, 1.20 MB
english, 2015
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