Time-resolved optical measurement of Si lattice temperature during nanosecond pulsed laser annealing
Kouichi Murakami, Hisayoshi Itoh, Kōki Takita, Kohzoh MasudaVolume:
117-118
Year:
1983
Language:
english
Pages:
3
DOI:
10.1016/0378-4363(83)90726-x
File:
PDF, 232 KB
english, 1983