Nucleation kinetics of Ru on silicon oxide and silicon nitride surfaces deposited by atomic layer deposition
Yim, Sung-Soo, Lee, Do-Joong, Kim, Ki-Su, Kim, Soo-Hyun, Yoon, Tae-Sik, Kim, Ki-BumVolume:
103
Year:
2008
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2938052
File:
PDF, 738 KB
english, 2008