Minority carrier lifetime degradation in boron-doped Czochralski silicon
Glunz, S. W., Rein, S., Lee, J. Y., Warta, W.Volume:
90
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1389076
File:
PDF, 542 KB
english, 2001