Film Thickness Dependence of Dielectric Properties of...

Film Thickness Dependence of Dielectric Properties of B a T i O 3 Thin Films Prepared by Sol-Gel Method

Hayashi, Takashi, Oji, Naoto, Maiwa, Hiroshi
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Volume:
33
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.33.5277
Date:
September, 1994
File:
PDF, 1.29 MB
1994
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