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Improved Conductance Method for Determining Interface Trap Density of Metal-Oxide-Semiconductor Device with High Series Resistance
Yang, Hyundoek, Son, Yunik, Choi, Sangmoo, Hwang, HyunsangVolume:
44
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.44.l1460
Date:
November, 2005
File:
PDF, 191 KB
english, 2005