Characterization of an indirect X-ray imaging detector by...

Ultramicroscopy 2015 / 01 Vol. 148

Characterization of an indirect X-ray imaging detector by simulation and experiment

Doshi, C., van Riessen, G., Balaur, E., de Jonge, M.D., Peele, A.G.
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Volume:
148
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2014.08.010
Date:
January, 2015
File:
PDF, 813 KB
english, 2015
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