[IEEE 31st European Solid-State Device Research Conference - Nuremberg, Germany (2001.9.11-2001.9.13)] 31st European Solid-State Device Research Conference - Gate and Source/Drain Engineering for 50 nm P-Channel MOSFET
Guegan, G., Deleonibus, S., Bertrand, G., Souil, D., Rivallin, P., Tedesco, S., Mur, P., Holliger, P., Nier, M.E.Year:
2001
Language:
english
DOI:
10.1109/essderc.2001.195228
File:
PDF, 613 KB
english, 2001